Atomic-scale double-slit interferometry with a focused electron probe
Nature, Published online: 19 August 2026; doi:10.1038/s41586-026-10914-9Double-slit interferometry at the atomic scale is demonstrated using scanning transmission electron microscopy to provide evidence of interference fringes generated with a focused electron beam encountering two silicon atomic columns separated by 1.36 Å.
Nature, Published online: 19 August 2026; doi:10.1038/s41586-026-10914-9Double-slit interferometry at the atomic scale is demonstrated using scanning transmission electron microscopy to provide evidence of interference fringes generated with a focused electron beam encountering two silicon atomic columns separated by 1.36 Å.
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